Patents are a representative intellectual product of intangible assets, and are used as an important objective standard to measure the technological level and innovation capacity of individuals, companies, and countries. Accordingly, the evaluation of patented technology is greatly emphasized as a means of investment and policy decision of each company or country, as well as technology transfer, licensing, and product development. Despite the lack of evidence that patent developers or companies intend to cite existing patents, it has been proven by various studies that frequently-cited-patents have high technical value. Patent citation analysis means to analyze not only the correlation, but also the relative importance, etc., through the analysis of the citation relationship between patents. Many researchers are analyzing the quality and influence of technology and the spread of technology information through patent citation analysis.
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| ▲wipsglobal.com |
WIPS Global's ‘Citation Analysis’ is an analysis of backward and forward citations. Citation data is provided based on the application number as the citation relationship occurs in the unit of invention, and the backward/forward citation relationship is checked by expanding to 3depth based on the root patent.
The citation
analysis feature is entered by selecting the citation analysis icon on the ‘View
Detail’ page after searching.
▲wipsglobal.com> Citation analysis
Citation
analysis is available for KR, US, CN, JP, EP, DE, BR, FR, RU, and TW countries.
You can set up to 3 depths for each backward/forward citation. If you click
on the number from the statistics of the backward/forward citations in the
right side, the corresponding patent list as a result.
The document
list is displayed by depth, country, and citation stage. The listed documents are
connected with additional features such as SmartAngle, Easy Viewer, My Folder, and
others.
▲wipsglobal.com> Citation analysis
Visual Mode makes
it easy to check at a glance by dividing by citation depth and year.
You can mark
only the countries you want to review with the highlight. If you select ‘Citation
Reference’, you can check the source of the citations, such as whether the
document was identified during the examination or it was used in the trial, or
it was written by the applicant.
▲wipsglobal.com> Citation analysis
It’s Depth formatted. This format helps users to review by depth based on the root patent. If you select a patent box, you can see summary information of the selected patent- document number, application number, title, applicant, original IPC, representative claim, summary -. Double-click, you will be connected to the ‘View Detail’ page. It would be very useful when examining all prior art documents, such as invalidity search or researching the application trend of the relevant technology.
▲wipsglobal.com> Citation analysis
In addition, there’s ‘Self-citations’ which cites your own patents (documents with the same applicant's name) and ‘Non-self citations’ which other applicants cited.
By self-citation, you can understand the strategic patent application status for the company's technology, and by Non-self citations, you can identify companies that are using or planning to use the technology commercially.
※ References
1. "The method find powerful patent or patent information analysis system using
patent citation analysis" by Jae-Bok Yoo, Young-Mee Chung
Proceedings of the Korean Information Science Society Conference, 2005.07b (July 1, 2005): 169-171
2. "Analysis of factors influencing patent citations" by JaeHeon Lee, Infoclue corp.
Journal of the Korean Society for Information Management 27, no. 1 (Mar. 1, 2010): 103-18.
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